@ARTICLE{Putek_Piotr_Two-level_2011,
 author={Putek, Piotr and Crevecoeur, Guillaume and Slodička, Marian and Gawrylczyk, Konstanty and van Keer, Roger and Dupré, Luc},
 volume={vol. 60},
 number={No 4 December},
 journal={Archives of Electrical Engineering},
 pages={497-518},
 howpublished={online},
 year={2011},
 publisher={Polish Academy of Sciences},
 abstract={This work deals with the inverse problem associated to 3D crack identification inside a conductive material using eddy current measurements. In order to accelerate the time-consuming direct optimization, the reconstruction is provided by the minimization of a last-square functional of the data-model misfit using space mapping (SM) methodology. This technique enables to shift the optimization burden from a time consuming and accurate model to the less precise but faster coarse surrogate model. In this work, the finite element method (FEM) is used as a fine model while the model based on the volume integral method (VIM) serves as a coarse model. The application of the proposed method to the shape reconstruction allows to shorten the evaluation time that is required to provide the proper parameter estimation of surface defects.},
 type={Artykuły / Articles},
 title={Two-level approach for solving the inverse problem of defects identification in Eddy Current Testing - type NDT},
 URL={http://ochroma.man.poznan.pl/Content/84592/PDF/09_paper.pdf},
 doi={10.2478/v10171-011-0041-4},
 keywords={defect characterization, electromagnetic inverse problem, two level optimization algorithms, eddy current testing method, sensitivity analysis},
}