@ARTICLE{Yinke_Dou_In-situ_2012,
 author={Yinke Dou and Xiaomin Chang},
 number={No 3},
 journal={Metrology and Measurement Systems},
 pages={583-592},
 howpublished={online},
 year={2012},
 publisher={Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation},
 abstract={Ice thickness is one of the most critical physical indicators in the ice science and engineering. It is therefore very necessary to develop in-situ automatic observation technologies of ice thickness. This paper proposes the principle of three new technologies of in-situ automatic observations of sea ice thickness and provides the findings of laboratory applications. The results show that the in-situ observation accuracy of the monitor apparatus based on the Magnetostrictive Delay Line (MDL) principle can reach ±2 mm, which has solved the “bottleneck” problem of restricting the fine development of a sea ice thermodynamic model, and the resistance accuracy of monitor apparatus with temperature gradient can reach the centimeter level and research the ice and snow substance balance by automatically measuring the glacier surface ice and snow change. The measurement accuracy of the capacitive sensor for ice thickness can also reach ±4 mm and the capacitive sensor is of the potential for automatic monitoring the water level under the ice and the ice formation and development process in water. Such three new technologies can meet different needs of fixed-point ice thickness observation and realize the simultaneous measurement in order to accurately judge the ice thickness.},
 type={Artykuły / Articles},
 title={In-situ automatic observations of ice thickness of seas},
 URL={http://ochroma.man.poznan.pl/Content/89981/PDF/Journal10178-VolumeXIXIssue3_15.pdf},
 doi={10.2478/v10178-012-0051-6},
 keywords={ice thickness, observation, MDL, resistance, capacitive induction.},
}