Title

Multiplicative Method for Reduction of Bias in Indirect Digital Measurement Result

Journal title

Metrology and Measurement Systems

Yearbook

2011

Issue

No 3

Authors

Muravyov, Sergey ; Zlygosteva, Galina ; Borikov, Valeriy

Keywords

bias ; error reduction technique ; shunt ohmic resistance ; indirect measurement

Divisions of PAS

Nauki Techniczne

Coverage

481-490

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2011

Type

Artykuły / Articles

Identifier

DOI: 10.2478/v10178-011-0014-x ; ISSN 2080-9050, e-ISSN 2300-1941

Source

Metrology and Measurement Systems; 2011; No 3; 481-490

References

Quaresma H. (2003), Improving dynamic resistance and differential capaci-tance measurement of active devices, null, 1, 959. ; Nadi M. (2008), Embedded system design and imple-mentation of standard auto-calibrated measurement chain, International Journal on Smart Sensing and In-telligent Systems, 1, 1, 21. ; Taymanov R. (2011), Sensor Devices with Metrological Self-Check, Sensors & Transducers Journal, 10, 2, 30. ; Bromberg E. (1978), Test methods for measurement accuracy improvement. ; Aliev T. (1986), Iteration methods for measurement ac-curacy improvement. ; Piotrowski J. (1992), Theory of physical and technical measurement. ; Ziegler S. (2009), Current Sensing Techniques: A Review, IEEE Sensors Journal, 9, 4, 354, doi.org/10.1109/JSEN.2009.2013914 ; Muravyov S. (2009), A Computer System: Measurement of Welding Surge Current, Measurement & Control, 42, 2, 44. ; Kawamura T. (2007), Recent Developments on High Current Measurement Using Current Shunt, Transactions on Electrical and Electronic Engineering, 2, 516, doi.org/10.1002/tee.20203 ; Regtien P. (2005), Measurement Science for Engineers. ; <i>Achieving Accurate and Reliable Resistance Measurements in Low Power and Low Voltage Applications.</i> (2004). White Paper. Keithley Instruments, Inc. ; Muravyov S. (2000), Model of procedure for measurement result correction, null, 5, 135. ; <i>NIST/SEMATECH e-Handbook of Statistical Methods</i>, 2. Measurement Process Characterization, 2.5. Uncertainty analysis <a target="_blank" href='http://www.itl.nist.gov/div898/handbook/mpc/section5/mpc5.htm'>http://www.itl.nist.gov/div898/handbook/mpc/section5/mpc5.htm</a> ; Muravyov S. (2009), Arrangement for shunts calibration. Patent on utility model no. 80585 (Russian Federation), Bull, 4.