Title

Soft Fault Clustering in Analog Electronic Circuits with the Use of Self Organizing Neural Network

Journal title

Metrology and Measurement Systems

Yearbook

2011

Issue

No 4

Authors

Grzechca, Damian

Keywords

fault detection ; parametric faults ; analogue electronic circuits ; self-organizing neural network

Divisions of PAS

Nauki Techniczne

Coverage

555-568

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2011

Type

Artykuły / Articles

Identifier

DOI: 10.2478/v10178-011-0054-8 ; ISSN 2080-9050, e-ISSN 2300-1941

Source

Metrology and Measurement Systems; 2011; No 4; 555-568

References

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