Tytuł artykułu

Ultrasonic Spectroscopy of Silicon Single Crystal

Tytuł czasopisma

Metrology and Measurement Systems

Rocznik

2011

Numer

No 4

Autorzy

Sedlak, Petr ; Tofel, Pavel ; Sedlakova, Vlasta ; Majzner, Jiri ; Sikula, Josef ; Hasse, Lech

Słowa kluczowe

non-destructive testing ; silicon single crystal ; electro-ultrasonic spectroscopy ; resonant ultrasonic spectroscopy

Wydział PAN

Nauki Techniczne

Zakres

621-630

Wydawca

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Data

2011

Typ

Artykuły / Articles

Identyfikator

DOI: 10.2478/v10178-011-0059-3 ; ISSN 2080-9050, e-ISSN 2300-1941

Źródło

Metrology and Measurement Systems; 2011; No 4; 621-630

Referencje

Hajek K. (2007), The improved system for electro-ultrasonic nonlinear spectroscopy, null, 71. ; Migliori A. (1997), Resonant Ultrasound Spectroscopy. ; Sedlakova V. (2008), Electro-ultrasonic spectroscopy of polymer based thick film layers, Microelectronics Reliability, 48, 6, 886, doi.org/10.1016/j.microrel.2008.03.011 ; Sedlakova V. (2007), Electro-ultrasonic spectroscopy of conducting solids, null, 523. ; Hasse L. (2009), Quality assessment of varistor ZnO structures by resonant ultrasound spectroscopy, Insight, 51, 5, 262, doi.org/10.1784/insi.2009.51.5.262 ; Kim Y. (2010), Feasible study on electro-ultrasonic spectroscopy of silicon single crystal, null, 301. ; Sikula J. (2008), Improved Signal to Noise Ratio of Electro-ultrasonic Spectroscopy, ElectroScope, 2, 6, 1. ; Hajek K. (2004), Improving the practical sensitivity of nonlinear ultrasound spectroscopy for one exciting signal, null, 51. ; Tofel P. (2009), NDT of single crystal CdTe and Si by electro-ultrasonic spectroscopy, null, 305. ; Hopcroft M. (2010), What is the Young's Modulus of Silicon?, Journal of Micro-electromechanical Systems, 19, 229.