Details Details PDF BIBTEX RIS Title Correction of the Refraction Phenomenon in Photogrammetric Measurement Systems Journal title Metrology and Measurement Systems Yearbook 2013 Issue No 4 Authors Samper, David ; Santolaria, Jorge ; Majarena, Ana Cristina ; Aguilar, Juan José Keywords refraction correction ; photogrammetry ; correction polynomials Divisions of PAS Nauki Techniczne Coverage 601-612 Publisher Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation Date 2013 Type Artykuły / Articles Identifier DOI: 10.2478/mms-2013-0051 ; ISSN 2080-9050, e-ISSN 2300-1941 Source Metrology and Measurement Systems; 2013; No 4; 601-612 <div class="test"></div>