Tytuł artykułu

Comparative Tests of Temperature Effects on the Performance of Gan and Sic Photodiodes

Tytuł czasopisma

Metrology and Measurement Systems

Rocznik

2015

Wolumin

vol. 22

Numer

No 1

Autorzy

Ćwirko, Joanna ; Ćwirko, Robert ; Mikołajczyk, Janusz

Słowa kluczowe

optical detectors ; UV radiation ; photodiode ; GaN detector ; SiC detector

Wydział PAN

Nauki Techniczne

Zakres

119-126

Wydawca

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Data

2015[2015.01.01 AD - 2015.12.31 AD]

Typ

Artykuły / Articles

Identyfikator

DOI: 10.1515/mms-2015-0010 ; ISSN 2080-9050, e-ISSN 2300-1941

Źródło

Metrology and Measurement Systems; 2015; vol. 22; No 1; 119-126

Referencje

Chen (2012), Analysis of temperature - dependent characteristics of a SiC metal - semiconductor - metal ultraviolet photodetector, Applied Physics, 57, 34, doi.org/10.1007/s11434-012-5494-3 ; Liu (2006), Demonstration of Ultraviolet SiC PIN Avalanche Photodiodes, IEEE Photonics Technology Letters, 18, 2508, doi.org/10.1109/LPT.2006.887211 ; Kim (2002), GaN metal - semiconductor - metal ultraviolet photodetector with IrO Schottky contact, Appl Phys Lett, 81, doi.org/10.1063/1.1524035 ; Chen (2001), GaN Metal - Semiconductor - Metal Ultraviolet Photodetectors With Transparent Indium - Tin - Oxide Schottky Contacts, IEEE Photonics Technology Letters, 8. ; Shur (2003), UV Solid - State Light Emitters and NATO II ISBN book, Detectors Science Series, 8, 144. ; Rogalski (1996), Semiconductor ultraviolet photodetectors, Appl Phys, 79. ; Zgorka (2001), Application of conventional UV photodiode array and fluorescence detection to analysis of phenolic acids in plant material and pharmaceutical preparations, Journal of Pharmaceutical and Biomedical Analysis, 24, 1065, doi.org/10.1016/S0731-7085(00)00541-0 ; Bielecki (2004), Photoreceiver for BLU / UV detection SPIE, Proc, 5472, doi.org/10.1117/12.547653 ; Kirschman (1999), Status of Silicon Carbide ( SiC as a WideBandgap Semiconductor for High Temperature Applications High - Temperature Electronics IEEE Press ISBN, Review, 11. ; Iucolano (2008), Influence of high - temperature GaN annealed surface on the electrical properties of Ni / GaN Schottky contacts, Appl Phys, 10, 104, doi.org/10.1063/1.3006133