Tytuł artykułu

Noise Properties Of Thick-Film Conducting Lines For Integrated Inductors

Tytuł czasopisma

Metrology and Measurement Systems

Rocznik

2015

Wolumin

vol. 22

Numer

No 2

Autorzy

Stadler, Adam Witold ; Kolek, Andrzej ; Mleczko, Krzysztof ; Zawiślak, Zbigniew ; Dziedzic, Andrzej ; Nowak, Damian

Słowa kluczowe

low-frequency noise ; thick-film conducting layer ; thick-film inductor

Wydział PAN

Nauki Techniczne

Zakres

229-240

Wydawca

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Data

2015[2015.01.01 AD - 2015.12.31 AD]

Typ

Artykuły / Articles

Identyfikator

DOI: 10.1515/mms-2015-0021 ; ISSN 2080-9050, e-ISSN 2300-1941

Źródło

Metrology and Measurement Systems; 2015; vol. 22; No 2; 229-240

Referencje

Verbruggen (1987), Correlation between fnoise and grain boundaries in thin gold films, Phys Rev, 35, 5864, doi.org/10.1103/PhysRevB.35.5864 ; Granqvist (2008), Electrochromic foil - based devices : Optical transmittance and modulation range , effect of ultraviolet irradiation , and quality assessment by fcurrent noise, Thin Solid Films, 17, 516. ; Stadler (2014), Noise spectroscopy of resistive components at elevated temperature, Metrol Meas Syst, 21, 15, doi.org/10.2478/mms-2014-0002 ; Bhattacharya (2000), Next generation integral passives : materials processes and integration of resistors and capacitors on PWB substrates Journal of Material Science : Materials in, Electronics, 11, 253. ; Jevtić (1995), Noise as a diagnostic and prediction tool in reliability physics, Microelectronics Reliability, 35, 455, doi.org/10.1016/0026-2714(95)93070-Q ; Zarnik (2013), Comparison of the intrinsic characteristics of LTCC and silicon pressure sensors by means of fnoise measurements, Radioengineering, 22, 227. ; Mleczko (2008), Evaluation of conductive - to - resistive layers interaction in thick - film resistors, Microelectronics Reliability, 48, 881, doi.org/10.1016/j.microrel.2008.03.012 ; Dziedzic (2006), Advanced electrical and stability characterization of untrimmed and variously trimmed thick - film and LTCC resistors, Microelectronics Reliability, 46, 352, doi.org/10.1016/j.microrel.2004.12.014 ; Stadler (2011), Virtual instruments in low - frequency noise spectroscopy experiments thInt of IMAPS - CPMT Poland Chapter, Proc Conf, 311. ; Dziedzic (2002), Electrical and structural investigations in reliability characterisation of modern passives and passive integrated components, Microelectronics Reliability, 42, 709, doi.org/10.1016/S0026-2714(02)00044-6 ; Rocak (2001), Low - frequency noise of thick - film resistors as quality and reliability indicator, Microelectronics Reliability, 41, 531, doi.org/10.1016/S0026-2714(00)00255-9 ; Balandin (2013), Low - frequency fnoise in graphene devices, Nature Nanotechnology, 8, 549, doi.org/10.1038/nnano.2013.144 ; Dziedzic (1998), fnoise in polymer thick - film resistors of, Journal Physics Applied Physics, 1, 2091, doi.org/10.1088/0022-3727/31/17/003 ; Lepaisant (1992), Low - noise preamplifier with input and feedback transformers for low source resistance sensors, Chok Rev Sci Instrum, 63, 2089, doi.org/10.1063/1.1143171 ; Jevtić (1999), Thick - film quality indictor based on noise index measurements, Microelectronics Journal, 30, 1255, doi.org/10.1016/S0026-2692(99)00050-6 ; Neri (1997), Noise and fluctuations in submicrometric Al - Si interconnect lines On, IEEE Transactions Electron Devices, 44, 1454, doi.org/10.1109/16.622601 ; Stadler (2011), Noise properties of thick - film resistors in extended temperature range, Microelectronics Reliability, 51, 1264, doi.org/10.1016/j.microrel.2011.02.023 ; Chun (2009), laser trimming technology for regulating embedded thick - film carbon resistors on a random access memory module of Materials Processing Technology, Journal, 209.