Tytuł artykułu

Soft-Fault Diagnosis of Analog Circuit with Tolerance Using FNLP

Tytuł czasopisma

Metrology and Measurement Systems

Rocznik

2010

Numer

No 3

Autorzy

Zhang, Wei ; Zhou, Longfu ; Shi, Yibing ; Huang, Chengti ; Li, Yanjun

Słowa kluczowe

analog circuit ; fault diagnosis ; sensitivity ; fuzzy ; nonlinear linear programming

Wydział PAN

Nauki Techniczne

Zakres

349-361

Wydawca

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Data

2010

Typ

Artykuły / Articles

Identyfikator

DOI: 10.2478/v10178-010-0030-8 ; ISSN 2080-9050, e-ISSN 2300-1941

Źródło

Metrology and Measurement Systems; 2010; No 3; 349-361

Referencje

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