Title

Ion etching of HgCdTe: Properties, patterns and use as a method for defect studies

Journal title

Opto-Electronics Review

Yearbook

2017

Volume

vol. 25

Issue

No 2

Authors

Izhnin, I.I. ; Mynbaev, K.D. ; Voitsekhovskii, A.V. ; Korotaev, A.G. ; Fitsych, O.I. ; Pociask-Bialy, M.

Keywords

HgCdTe ; Ion etching ; Photodetectors ; Defects ; Doping

Divisions of PAS

Nauki Techniczne

Coverage

148-170

Publisher

Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology

Date

29.04.2017

Type

Article

Identifier

ISSN 1896-3757

Source

Opto-Electronics Review; 2017; vol. 25; No 2; 148-170

Abstracting & Indexing

Abstracting and Indexing:
Arianta
BazTech
EBSCO relevant databases
EBSCO Discovery Service
SCOPUS relevant databases
ProQuest relevant databases
Clarivate Analytics relevant databases
WangFang

additionally:
ProQuesta (Ex Libris, Ulrich, Summon)
Google Scholar