Title

Study of the spatial distribution of minority carrier diffusion length in epiplanar detector structures

Journal title

Opto-Electronics Review

Yearbook

2015

Volume

vol. 23

Issue

No 4

Authors

Piotrowski, T. ; Węgrzecki, M. ; Stolarski, M. ; Gościński, K. ; Krajewski, T.

Keywords

effective minority diffusion length ; surface recombination velocity ; epiplanar detector ; p-n structures

Divisions of PAS

Nauki Techniczne

Coverage

265-270

Publisher

Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology

Date

07.10.2015

Type

Article

Identifier

ISSN 1896-3757

Source

Opto-Electronics Review; 2015; vol. 23; No 4; 265-270