Title

Soft X-ray Diagnostic System Upgrades and Data Quality Monitoring Features for Tokamak Usage

Journal title

International Journal of Electronics and Telecommunications

Yearbook

2021

Volume

vol. 67

Issue

No 1

Affiliation

Wojenski, Andrzej : Warsaw University of Technology, Institute of Electronics Systems, Poland ; Linczuk, Paweł : Warsaw University of Technology, Institute of Electronics Systems, Poland ; Kolasinski, Piotr : Warsaw University of Technology, Institute of Electronics Systems, Poland ; Chernyshova, Maryna : Institute of Plasma Physics and Laser Microfusion, Warsaw, Poland ; Mazon, Didier : CEA, Saint-Paul-lez-Durance, France ; Kasprowicz, Grzegorz : Warsaw University of Technology, Institute of Electronics Systems, Poland ; Pozniak, Krzysztof T. : Warsaw University of Technology, Institute of Electronics Systems, Poland ; Gaska, Michał : Warsaw University of Technology, Institute of Electronics Systems, Poland ; Czarski, Tomasz : Institute of Plasma Physics and Laser Microfusion, Warsaw, Poland ; Krawczyk, Rafał : Warsaw University of Technology, Institute of Electronics Systems, Poland ; Krawczyk, Rafał : CERN, Geneva, Switzerland

Authors

Wojenski, Andrzej ; Linczuk, Paweł ; Kolasinski, Piotr ; Chernyshova, Maryna ; Mazon, Didier ; Kasprowicz, Grzegorz ; Pozniak, Krzysztof T. ; Gaska, Michał ; Czarski, Tomasz ; Krawczyk, Rafał

Keywords

data quality monitoring ; FPGA ; Verilog/VHDL ; HDL ; GEM detector ; SXR plasma diagnostics ; modular measurement system ; data evaluation ; tokamak

Divisions of PAS

Nauki Techniczne

Coverage

109-114

Publisher

Polish Academy of Sciences Committee of Electronics and Telecommunications

Date

2021.02.17

Type

Article

Identifier

DOI: 10.24425/ijet.2021.135951

Source

International Journal of Electronics and Telecommunications; 2021; vol. 67; No 1; 109-114