Szczegóły Szczegóły PDF BIBTEX RIS Tytuł artykułu Measurement Capabilities Upgrade of GEM Soft X-ray Measurement System for Hot Plasma Diagnostics Tytuł czasopisma International Journal of Electronics and Telecommunications Rocznik 2021 Wolumin vol. 67 Numer No 1 Autorzy Linczuk, Paweł ; Wojenski, Andrzej ; Kolasinski, Piotr ; Krawczyk, Rafał ; Zabolotny, Wojciech ; Pozniak, Krzysztof ; Chernyshova, Maryna ; Czarski, Tomasz ; Gaska, Michał ; Kasprowicz, Grzegorz ; Malinowski, Karol Afiliacje Linczuk, Paweł : Institute of Electronic Systems, Faculty of Electronics and Information Technology, University of Technology, Warsaw, Poland ; Wojenski, Andrzej : Institute of Electronic Systems, Faculty of Electronics and Information Technology, University of Technology, Warsaw, Poland ; Kolasinski, Piotr : Institute of Electronic Systems, Faculty of Electronics and Information Technology, University of Technology, Warsaw, Poland ; Krawczyk, Rafał : Institute of Electronic Systems, Faculty of Electronics and Information Technology, University of Technology, Warsaw, Poland ; Krawczyk, Rafał : CERN, Geneva, Switzerland ; Zabolotny, Wojciech : Institute of Electronic Systems, Faculty of Electronics and Information Technology, University of Technology, Warsaw, Poland ; Pozniak, Krzysztof : Institute of Electronic Systems, Faculty of Electronics and Information Technology, University of Technology, Warsaw, Poland ; Chernyshova, Maryna : Institute of Plasma Physics and Laser Microfusion, Warsaw, Poland ; Czarski, Tomasz : Institute of Plasma Physics and Laser Microfusion, Warsaw, Poland ; Gaska, Michał : Institute of Electronic Systems, Faculty of Electronics and Information Technology, University of Technology, Warsaw, Poland ; Kasprowicz, Grzegorz : Institute of Electronic Systems, Faculty of Electronics and Information Technology, University of Technology, Warsaw, Poland ; Malinowski, Karol : Institute of Plasma Physics and Laser Microfusion, Warsaw, Poland Słowa kluczowe Measurement system ; GEM ; DAQ Wydział PAN Nauki Techniczne Zakres 115-120 Wydawca Polish Academy of Sciences Committee of Electronics and Telecommunications Data 2021.02.17 Typ Article Identyfikator DOI: 10.24425/ijet.2021.135952 ; eISSN 2300-1933 (since 2013) ; ISSN 2081-8491 (until 2012) Źródło International Journal of Electronics and Telecommunications; 2021; vol. 67; No 1; 115-120