Tytuł artykułu

Two-step etch in n-on-p type-II superlattices for surface leakage reduction in mid-wave infrared megapixel detectors

Tytuł czasopisma

Opto-Electronics Review

Rocznik

2023

Wolumin

31

Numer

special issue

Autorzy

Ramos, David ; Delmas, Marie ; Ivanov, Ruslan ; Žurauskaitė, Laura ; Evans, Dean ; Almqvist, Susanne ; Becanovic, Smilja ; Hellström, Per-Erik ; Costard, Eric ; Höglund, Linda

Afiliacje

Ramos, David : IRnova AB, Isafjordsgatan 22, Kista 164 40, Sweden ; Ramos, David :  School of Electrical Engineering and Computer Science KTH Royal Institute of Technology, Isafjordsgatan 22, Kista 164 40, Sweden ; Delmas, Marie : IRnova AB, Isafjordsgatan 22, Kista 164 40, Sweden ; Ivanov, Ruslan : IRnova AB, Isafjordsgatan 22, Kista 164 40, Sweden ; Žurauskaitė, Laura : IRnova AB, Isafjordsgatan 22, Kista 164 40, Sweden ; Evans, Dean : IRnova AB, Isafjordsgatan 22, Kista 164 40, Sweden ; Almqvist, Susanne : IRnova AB, Isafjordsgatan 22, Kista 164 40, Sweden ; Becanovic, Smilja : IRnova AB, Isafjordsgatan 22, Kista 164 40, Sweden ; Hellström, Per-Erik :  School of Electrical Engineering and Computer Science KTH Royal Institute of Technology, Isafjordsgatan 22, Kista 164 40, Sweden ; Costard, Eric : IRnova AB, Isafjordsgatan 22, Kista 164 40, Sweden ; Höglund, Linda : IRnova AB, Isafjordsgatan 22, Kista 164 40, Sweden

Słowa kluczowe

infrared detector ; surface leakage ; type-II superlattice ; megapixel; n-on-p

Wydział PAN

Nauki Techniczne

Zakres

e144556

Wydawca

Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology

Data

24.02.2023

Typ

Article

Identyfikator

DOI: 10.24425/opelre.2023.144556 ; ISSN 1896-3757

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