Title

The method for extracting defect levels in the MCT multilayer low-bandgap heterostructures

Journal title

Opto-Electronics Review

Yearbook

2024

Volume

32

Issue

1

Authors

Majkowycz, Kinga ; Kopytko, Małgorzata ; Murawski, Krzysztof ; Martyniuk, Piotr

Affiliation

Majkowycz, Kinga : Institute of Applied Physics, Military University of Technology, ul. gen. Sylwestra Kaliskiego 2, 00-908 Warsaw, Poland ; Kopytko, Małgorzata : Institute of Applied Physics, Military University of Technology, ul. gen. Sylwestra Kaliskiego 2, 00-908 Warsaw, Poland ; Murawski, Krzysztof : Institute of Applied Physics, Military University of Technology, ul. gen. Sylwestra Kaliskiego 2, 00-908 Warsaw, Poland ; Martyniuk, Piotr : Institute of Applied Physics, Military University of Technology, ul. gen. Sylwestra Kaliskiego 2, 00-908 Warsaw, Poland

Keywords

deep-level transient spectroscopy (DLTS) ; traps ; MOCVD ; MCT

Divisions of PAS

Nauki Techniczne

Coverage

e149182

Publisher

Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology

Date

18.02.2024

Type

Article

Identifier

DOI: 10.24425/opelre.2024.149182

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