Tytuł artykułu

Analysis of the impact of post-process modifications on the properties of TiO₂ thin films with high-temperature stable anatase phase deposited by the electron beam evaporation method

Tytuł czasopisma

Opto-Electronics Review

Rocznik

2024

Wolumin

32

Numer

4

Autorzy

Obstarczyk, Agata ; Mańkowska, Ewa ; Weichbrodt, Wiktoria ; Kapuścik, Paulina ; Kijaszek, Wojciech ; Mazur, Michał

Afiliacje

Obstarczyk, Agata : Faculty of Electronics, Photonics and Microsystems, Wroclaw University of Science & Technology, ul. Janiszewskiego 11/17, 50-372 Wroclaw, Poland ; Mańkowska, Ewa : Faculty of Electronics, Photonics and Microsystems, Wroclaw University of Science & Technology, ul. Janiszewskiego 11/17, 50-372 Wroclaw, Poland ; Weichbrodt, Wiktoria : Faculty of Electronics, Photonics and Microsystems, Wroclaw University of Science & Technology, ul. Janiszewskiego 11/17, 50-372 Wroclaw, Poland ; Kapuścik, Paulina : Faculty of Electronics, Photonics and Microsystems, Wroclaw University of Science & Technology, ul. Janiszewskiego 11/17, 50-372 Wroclaw, Poland ; Kijaszek, Wojciech : Faculty of Electronics, Photonics and Microsystems, Wroclaw University of Science & Technology, ul. Janiszewskiego 11/17, 50-372 Wroclaw, Poland ; Mazur, Michał : Faculty of Electronics, Photonics and Microsystems, Wroclaw University of Science & Technology, ul. Janiszewskiego 11/17, 50-372 Wroclaw, Poland

Słowa kluczowe

post-process annealing ; electron beam evaporation ; TiO2 ; coating ; high-temperature stable anatase

Wydział PAN

Nauki Techniczne

Zakres

e151991

Wydawca

Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology

Data

15.10.2024

Typ

Article

Identyfikator

DOI: 10.24425/opelre.2024.151991 ; ISSN 1896-3757

Indeksowanie w bazach

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