Details Details PDF BIBTEX RIS Title Upgrading Frequency Test for Overlapping Vectors and Fill Tree Tests Journal title International Journal of Electronics and Telecommunications Yearbook 2025 Volume vol. 71 Issue No 2 Authors Mańk, Krzysztof Affiliation Mańk, Krzysztof : Military University of Technology, Poland Keywords randomness testing ; overlapping vectors testing ; NIST STS ; Dieharder Divisions of PAS Nauki Techniczne Coverage 443-451 Publisher Polish Academy of Sciences Committee of Electronics and Telecommunications Date 4.06.2025 Type Article Identifier DOI: 10.24425/ijet.2025.153591