Details

Title

Upgrading Frequency Test for Overlapping Vectors and Fill Tree Tests

Journal title

International Journal of Electronics and Telecommunications

Yearbook

2025

Volume

vol. 71

Issue

No 2

Authors

Affiliation

Mańk, Krzysztof : Military University of Technology, Poland

Keywords

randomness testing ; overlapping vectors testing ; NIST STS ; Dieharder

Divisions of PAS

Nauki Techniczne

Coverage

443-451

Publisher

Polish Academy of Sciences Committee of Electronics and Telecommunications

Date

4.06.2025

Type

Article

Identifier

DOI: 10.24425/ijet.2025.153591
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