Details Details PDF BIBTEX RIS Title Efficient transient simulation of efuse Journal title International Journal of Electronics and Telecommunications Yearbook 2025 Volume vol. 71 Issue No 3 Authors Jaworski, Zbigniew Affiliation Jaworski, Zbigniew : Warsaw University of Technology, Institute of Microelectronics and Optoelectronics, Poland Keywords Efuse ; Verilog-A ; transient simulation ; OTP memory ; FD-SOI ; CMOS Divisions of PAS Nauki Techniczne Coverage 1–6 Publisher Polish Academy of Sciences Committee of Electronics and Telecommunications Date 11.07.2025 Type Article Identifier DOI: 10.24425/ijet.2025.153636 <div class="test"></div>