Details Details PDF BIBTEX RIS Title Evolutionary algorithms for global parametric fault diagnosis in analogue integrated circuits Journal title Bulletin of the Polish Academy of Sciences Technical Sciences Yearbook 2012 Volume 60 Issue No 1 Authors Grzechca, D. ; Rutkowski, J. ; Jantos, P. Divisions of PAS Nauki Techniczne Coverage 133-142 Date 2012 Identifier DOI: 10.2478/v10175-012-0019-4 ; ISSN 2300-1917 Source Bulletin of the Polish Academy of Sciences: Technical Sciences; 2012; 60; No 1; 133-142 References Chakrabarti S. (1999), Compact fault dictionary construction for efficient isolation of faults in analog and mixed-signal circuits, null, 1, 327. ; Chakrabarti S. (1999), Fault diagnosis for mixedsignal electronic systems, null, 3, 169. ; Kabisatpathy P. (2005), Fault Diagnosis of Analogue Integrated Circuits. ; Cherubal S. (2001), Test generation based diagnosis of device parameters for analog circuits, null, 1, 596. ; Huertas J. 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