Details

Title

Evolutionary algorithms for global parametric fault diagnosis in analogue integrated circuits

Journal title

Bulletin of the Polish Academy of Sciences Technical Sciences

Yearbook

2012

Volume

60

Issue

No 1

Authors

Divisions of PAS

Nauki Techniczne

Coverage

133-142

Date

2012

Identifier

DOI: 10.2478/v10175-012-0019-4 ; ISSN 2300-1917

Source

Bulletin of the Polish Academy of Sciences: Technical Sciences; 2012; 60; No 1; 133-142

References

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(2008), Dictionary method for multiple soft and catastrophic fault diagnosis based on evolutionary computation, null, 1, 553. ; Jantos P. (2008), Heuristic methods to test frequency optimization for analogue circuits diagnosis, Bull. Pol. Ac.: Tech, 56, 1, 29. ; Jantos P. (2009), Global parametric faults identification in analogue electronic circuits, Metrology and Measurement Systems, XVI, 3, 391. ; Grzechca D. (2009), Fault diagnosis in analog electronic circuits - the SVM approach, Metrology and Measurement Systems, XVI, 4, 583. ; Laker K. (1994), Design of Analog Integrated Circuits and Systems. ; Millman J. (1972), Integrated Electronics: Analog and Digital Circuits and Systems. ; Ytterdal T. (2003), Device Modeling for Analog and RF CMOS Circuit Design, doi.org/10.1002/0470863803 ; Razavi B. (2001), Design of Analog CMOS Integrated Circuits. ; P. van Zant (2004), Microchip Fabrication: a Practical Guide to Semi-conductor Processing. ; Gray P. 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