Title

A Novel Approach of Analog Fault Classification Using a Support Vector Machines Classifier

Journal title

Metrology and Measurement Systems

Yearbook

2010

Issue

No 4

Authors

Cui, Jiang ; Wang, Youren

Keywords

analog circuits ; fault classification ; Support Vector Machines Classifier ; Neural Networks ; wavelet packet decomposition

Divisions of PAS

Nauki Techniczne

Coverage

561-581

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2010

Type

Artykuły / Articles

Identifier

DOI: 10.2478/v10178-010-0046-0 ; ISSN 2080-9050, e-ISSN 2300-1941

Source

Metrology and Measurement Systems; 2010; No 4; 561-581

References

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