Nauki Techniczne

Opto-Electronics Review

Opis

Opto-Electronics Review is peer-reviewed and quarterly published by the Polish Academy of Sciences (PAN) and the Association of Polish Electrical Engineers (SEP) in electronic version. It covers the whole field of theory, experimental techniques, and instrumentation and brings together, within one journal, contributions from a wide range of disciplines. The scope of the published papers includes any aspect of scientific, technological, technical and industrial works concerning generation, transmission, transformation, detection and application of light and other forms of radiative energy whose quantum unit is photon. Papers covering novel topics extending the frontiers in optoelectronics or photonics are very encouraged.
It has been established for the publication of high-quality original papers from the following fields:

Optical Design and Applications,
Image Processing (without AI Algorithm Optimisation)
Plasmonics, nanooptics, and metamaterials,
Optoelectronic Materials,
Micro-Opto-Electro-Mechanical Systems,
Infrared Physics and Technology,
Modelling of Optoelectronic Devices, Semiconductor Lasers

Technology and Fabrication of Optoelectronic Devices,
Photonic Crystals,
Laser Physics, Technology and Applications,
Optical Sensors and Applications,
Photovoltaics,
Biomedical Optics and Photonics

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Journal Metrics:

JCR Impact Factor 2023:	1.3
5 Year Impact Factor 2022:	2
SCImago Journal Rank (SJR) 2023:	0.267
Source Normalized Impact per Paper (SNIP) 2023:	0.525
CiteScore 2023:	1.9
Ministry of Education and Science 2021*:	100 points

* changed Dec. 1st, 2021

From 1992 to 2005 the Journal was published only in the paper form. From 2006 it was available also online. Since 2017 Opto-Eelectronics Review is published only in electronic form. All volumes issued online by the end of 2019 can be found on the following websites:

Years 2017-2019: https://www.sciencedirect.com/journal/opto-electronics-review/issues
Years 2015-2016: https://www.degruyter.com/view/j/oere
Years 2006-2014: https://link.springer.com/journal/volumesAndIssues/11772
Years 1992-2005 (scanned version): https://optor.wat.edu.pl/contents.htm

ISSN

ISSN 1896-3757

Wydawcy

Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology

Opto-Electronics Review - Editorial Board

Editor-in-Chief:
L. R. JAROSZEWICZ, Military University of Technology, Warsaw, Poland

Deputy Editor-in Chief:
P. MARTYNIUK, Military University of Technology, Warsaw, Poland

Board of Co-editors:

Optical Design and Applications
V.O. ANGELSKY, Chernivtsi National University, Chernivtsi, Ukraine

Image Processing
M. JÓŹWIK, Warsaw University of Technology, Warsaw, Poland

Plasmonics, nanooptics, and metamaterials
T. ANTOSIEWICZ, Warsaw University, Warsaw, Poland

Modelling of Optoelectronic Devices. Semiconductor Lasers
M. DEMS, Łódź Technical University, Łódź, Poland

Optoelectronics Materials
D. DOROSZ, AGH University of Science and Technology, Cracow, Poland

Micro-Opto-Electro-Mechanical Systems
T.P. GOTSZALK, Wrocław University of Technology, Wrocław, Poland

Infrared Physics and Technology
M. KOPYTKO, Military University of Technology, Warsaw, Poland
F. WANG, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, China

Technology and Fabrication of Optoelectronic Devices
J. MUSZALSKI, Institute of Electron Technology, Warsaw, Poland

Photonic Crystals
K. PANAJOTOV, Vrije Universiteit Brussels, Brussels, Belgium

Laser Physics, Technology and Applications
J. ŚWIDERSKI, Warsaw University of Technology, Warsaw, Poland

Optical Sensors and Applications
M. ŚMIETANA, Warsaw University of Technology, Warsaw, Poland

Photovoltaics
A. IWAN, Military Institute of Engineer Technology, Wroclaw, Poland

Biomedical Optics and Photonics
A. LIEBERT, Institute of Biocybernetics and Biomedical Engineering, Warsaw, Poland

International Editorial Advisory Board

D. BIMBERG, Technische Universitaet Berlin, Berlin, Germany

F. CAPASSO, Harvard University, Cambridge, USA

A.I. DIROCHKA, Production Center ORION, Moscow, Russia

P.G. ELISEEV, University of New Mexico, Albuquerque, USA

P. HARING−BOLIVAR, University of Siegen, Siegen, Germany

M. HENINI, University of Nottingham, Nottingham, England

B. JASKORZYNSKA, Royal Institute of Technology, Kista, Sweden

M. KIMATA, Ritsumeikan University, Shiga, Japan

R. KLETTE, University of Auckland, Auckland, New Zealand

S. KRISHNA, University of New Mexico, Albuquerque, USA

H.C. LIU, Shanghai Jiao Tong University, Shanghai, China

J. MISIEWICZ, Wrocław University of Technology, Wrocław, Poland

E. OZBAY, Bilkent University, Ankara, Turkey

J.G. PELLEGRINI, Night Vision and Electronic Sensors Directorate, Fort Belvoir, USA

M. RAZEGHI, Northwestern University, Evanston, USA

A. ROGALSKI, Military University of Technology, Warsaw, Poland

P. RUSSELL, Max Planck Institute for the Science of Light, Erlangen, Germany

V. RYZHII, University of Aizu, Aizu, Japan

C. SIBILIA, Universita' di Roma “La Sapienza”, Roma, Italy

A. TORRICELLI, Politecnico di Milano, Milano, Italy

T. WOLIŃSKI, Warsaw University of Technology, Warsaw, Poland

W. WOLIŃSKI, Warsaw University of Technology, Warsaw, Poland

S.−T. WU, University of Central Florida, Orlando, USA

Y.P. YAKOVLEV, Ioffe Physicotechnical Institute, St. Petersburg, Russia

J. ZIELŃSKI, Military University of Technology, Warsaw, Poland

Language Editor

J. Kulesza, e-mail: jolanta.kulesza@wat.edu.pl

Technical Editors:

R.Podraza, e-mail: renata.podraza@wat.edu.pl

E.Sadowska, e-mail: elzbieta.sadowska@wat.edu.pl

Publisher:

Polish Academy of Sciences and Association of Polish Electrical Engineers

Editorial office:

Military University of Technology,

ul. gen. Sylwestra Kaliskiego 2

00 – 908 Warsaw, Poland

opelre@wat.edu.pl

Opto-Electronics Review is an open access journal with all content available with no charge in full text version.

The journal content is available under the Creative Commons Attribution 4.0 International License ( http://creativecommons.org/licenses/by/4.0/).

Roczniki i numery
Instrukcja dla autorów
Dodatkowe informacje

Wybierz numer

Zawartość

Opto-Electronics Review | 2023 | 31 | 4

1 Detection system for a miniature MEMS X-ray source

Paweł Urbański , Tomasz Grzebyk

Opto-Electronics Review | 2023 | 31 | 4 | e147028 | DOI: 10.24425/opelre.2023.147038

Słowa kluczowe: X-rays luminophore scintillator

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Abstrakt

The article presents the results of experiments on a detection system used for detecting signals from a miniature, low-energy micro-electro-mechanical system (MEMS) X-ray source. The authors propose to use a detection based on luminescence phenomena occurring in luminophore and scintillators to record the visual signal on a CMOS/CCD detector. The main part of the article is a review of various materials of scintillators and luminophores which would be adequate to convert low-energy X-ray radiation (E < 25 keV – it is a range not typical for conventional X-ray systems) to visible light. Measurements obtained for different energies, exposure times, and different targets have been presented and analysed.

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Autorzy i Afiliacje

Paweł Urbański

e-mail:

ORCID:

Tomasz Grzebyk

e-mail:

ORCID:

Faculty of Electronics, Photonics and Microsystems, Wrocław University of Science and Technologyul. Janiszewskiego 11/17, 50-372 Wrocław, Poland

2 Chromaticity measurement of airport navigation lighting using integrated colour sensor

Jakub Suder , Kacper Podbucki , Tomasz Marciniak

Opto-Electronics Review | 2023 | 31 | 4 | e147040 | DOI: 10.24425/opelre.2023.147040

Słowa kluczowe: colour sensor chromaticity CIE1931 aeronautical ground lights airport navigation lighting EASA

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Abstrakt

The paper presents an analysis of using a TCS3430 light colour sensor to verify the chromaticity of navigation lighting installed at airports. These measurements can help determine the correct operation of the tested lamp using of specialised measuring devices. The emitted light colour is critical for pilots during flight operations such as take-off, landing and taxiing, especially in low visibility conditions. Chromaticity standards (in CIE1931 colour space) are specified in the relevant regulations of the European Union Aviation Safety Agency (EASA) and the International Civil Aviation Organisation (ICAO), and require regular inspection of each light point (both in-pavement and elevated lamps). Tests were carried out for various types of aviation navigation lighting lamps. The stability of measurements and possibilities of visualization on the chromaticity chart were assessed. The article also presents software that allows for quick verification of the operation of a given lamp, intended for airport maintenance services.

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Autorzy i Afiliacje

Jakub Suder

e-mail:

ORCID:

Kacper Podbucki

e-mail:

ORCID:

Tomasz Marciniak

e-mail:

ORCID:

Division of Signal Processing and Electronic Systems, Institute of Automatic Control and Robotics, Poznan University of Technology, Pl. Marii Skłodowskiej-Curie 5, 60-965 Poznań, Poland

3 The growth and characterisation of type I GaSb/AlSb superlattice with a thin GaSb layer

Maciej Fokt , Agata Jasik , Iwona Sankowska , Herbert S. Mączko , Karolina M. Paradowska , Krzysztof Czuba

Opto-Electronics Review | 2023 | 31 | 4 | e147912 | DOI: 10.24425/opelre.2023.147912

Słowa kluczowe: Type I AlSb/GaSb superlattice 8-band k·p perturbation theory nextnano simulations AlSb layer degradation

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Abstrakt

This paper presents results of the characterisation of type I GaSb/AlSb superlattices (SLs) with a thin GaSb layer and varying thicknesses of an AlSb layer. Nextnano software was utilized to obtain spectral dependence of absorption and energy band structure. A superlattice (SL) with an energy bandgap of ~ 1.0 eV and reduced mismatch value was selected for experimental investigation. SLs with single (sample A) and double (sample B) AlSb barriers and a single AlSb layer (sample C) were fabricated using molecular beam epitaxy (MBE). Optical microscopy, high-resolution X-ray diffractometry, and photoluminescence were utilized for structural and optical characterisation. The presence of satellite and interference peaks in diffraction curves confirms the high crystal quality of superlattices. Photoluminescence signal associated with the superlattice was observed only for sample B and contained three low-intensity peaks: 1.03, 1.18, and 1.25 eV. The first peak was identified as the value of the energy bandgap of the SL. Other two peaks are related to optical transitions between defect states located at the interface between the SL and the top AlSb barrier. The time-dependent changes observed in the spectral characteristics are due to a modification of the SL/AlSb interface caused by the oxidation and hydroxylation of the AlSb layer.

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Autorzy i Afiliacje

Maciej Fokt

1 2

e-mail:

ORCID:

Agata Jasik

e-mail:

ORCID:

Iwona Sankowska

e-mail:

ORCID:

Herbert S. Mączko

e-mail:

ORCID:

Karolina M. Paradowska

e-mail:

ORCID:

Krzysztof Czuba

1 2

e-mail:

ORCID:

Łukasiewicz Research Network – Institute of Microelectronics and Photonics, Aleja Lotników 32/46, 02-668 Warsaw, Poland
Warsaw University of Technology, ul. Nowowiejska 15/19, 00-665 Warsaw, Poland
nextnano GmbH, Konrad-Zuse-Platz 8, 81829 München, Germany

4 Photovoltaic modules with a modified ETFE foil for BIPV applications

Kazimierz Drabczyk , Grażyna Kulesza-Matlak , Piotr Sobik , Olgierd Jeremiasz

Opto-Electronics Review | 2023 | 31 | 4 | e147914 | DOI: 10.24425/opelre.2023.147914

Słowa kluczowe: photovoltaics lightweight photovoltaic module building integrated photovoltaics

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Abstrakt

This article introduces a laboratory-scale concept and research on photovoltaic (PV) modules designed for building integrated photovoltaics (BIPV) market, with enhanced architectural aesthetics and no protective glass. The proposed concept involves replacing a typical glass protective and load-bearing element of PV modules with an ethylene tetrafluoroethylene (ETFE) foil while using an aluminium sheet as a load-bearing element in the system. To further enhance the visual appeal of the solution, special modifications were proposed to the geometry of the front security foil. To confirm the feasibility of the proposed concept for mass production, critical tests were conducted on the material system and the process of modifying the surface of the ETFE foil. These tests included evaluating adhesion strength between layers, optical transmission coefficients, and electrical parameters of the developed PV modules. Additionally, the effect of the ETFE film modification on the formation of micro-cracks in solar cells was also investigated.

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Autorzy i Afiliacje

Kazimierz Drabczyk

e-mail:

ORCID:

Grażyna Kulesza-Matlak

e-mail:

ORCID:

Piotr Sobik

e-mail:

ORCID:

Olgierd Jeremiasz

e-mail:

ORCID:

Institute of Metallurgy and Materials Science, Polish Academy of Sciences, ul. Reymonta 25, 30-059 Kraków, Poland
Helioenergia Sp. z o.o., ul. Rybnicka 68, 44-238 Czerwionka-Leszczyny, Poland

5 Application of Al ₂O ₃ ZnO, and TiO ₂ ALD thin films as antireflection coating in the silicon solar cells

Marek Szindler , Magdalena M. Szindler

Opto-Electronics Review | 2023 | 31 | 4 | e148223 | DOI: 10.24425/opelre.2023.148223

Słowa kluczowe: optical thin film antireflection coating atomic layer deposition solar cells

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Abstrakt

The article describes the results of a research on the surface morphology and optical properties of Al ₂O ₃, ZnO, and TiO ₂ thin films deposited by atomic layer deposition (ALD) for applications in silicon solar cells. The surface topography and elemental composition were characterised using a scanning electron microscope, and thickness was determined using an optical reflectometer. The samples were structurally examined using a Raman spectrometer. The structural variant was identified: for Al ₂O ₃ it is sapphire, for TiO ₂ it is anatase, and for ZnO it is wurtzite. Possibilities of minimising light reflection using single and double thin film systems below 5% were presented. For the first time, the effectiveness of these thin films on the current-voltage characteristics and electrical parameters of manufactured silicon solar cells was examined and compared. The solar cell with the highest efficiency of converting solar radiation into electricity was obtained for Al ₂O ₃/TiO ₂ and the efficiency of such a photovoltaic device was 18.74%.

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Autorzy i Afiliacje

Marek Szindler

e-mail:

ORCID:

Magdalena M. Szindler

e-mail:

ORCID:

Scientific and Didactic Laboratory of Nanotechnology and Material Technologies, Faculty of Mechanical Engineering, Silesian University of Technology, ul. Towarowa 7, 44-100 Gliwice, Poland
Department of Engineering Materials and Biomaterials, Faculty of Mechanical Engineering, Silesian University of Technology, ul. Konarskiego 18a, 44-100 Gliwice, Poland

6 Morphology of an ITO recombination layer deposited on a silicon wire texture for potential silicon/perovskite tandem solar cell applications

Grażyna Kulesza-Matlak , Marek Szindler , Magdalena M. Szindler , Anna Sypień , Łukasz Major , Kazimierz Drabczyk

Opto-Electronics Review | 2023 | 31 | 4 | e148222 | DOI: 10.24425/opelre.2023.148222

Słowa kluczowe: tandem solar cell silicon nanowires MAE etching; ITO recombination layer

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Abstrakt

This paper presents research on the deposition of an indium tin oxide (ITO) layer which may act as a recombination layer in a silicon/perovskite tandem solar cell. ITO was deposited by magnetron sputtering on a highly porous surface of silicon etched by the metal-assisted etching method (MAE) for texturing as nano and microwires. The homogeneity of the ITO layer and the degree of coverage of the silicon wires were assessed using electron microscopy imaging techniques. The quality of the deposited layer was specified, and problems related to both the presence of a porous substrate and the deposition method were determined. The presence of a characteristic structure of the deposited ITO layer resembling a "match" in shape was demonstrated. Due to the specificity of the porous layer of silicon wires, the ITO layer should not exceed 80 nm. Additionally, to avoid differences in ITO thickness at the top and base of the silicon wire, the layer should be no thicker than 40 nm for the given deposition parameters.

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Autorzy i Afiliacje

Grażyna Kulesza-Matlak

e-mail:

ORCID:

Marek Szindler

e-mail:

ORCID:

Magdalena M. Szindler

e-mail:

ORCID:

Anna Sypień

e-mail:

ORCID:

Łukasz Major

e-mail:

ORCID:

Kazimierz Drabczyk

e-mail:

ORCID:

Institute of Metallurgy and Materials Science, Polish Academy of Sciences, ul. W. Reymonta 25, 30-059 Kraków, Poland
Faculty of Mechanical Engineering, Silesian University of Technology, ul. Akademicka 2A, 44-100 Gliwice, Poland

7 Advances in hybridised and inorganic composite metal halide perovskites: A review

Hariana I. Farfan , Karol L. Roa , Hugo F. Castro

Opto-Electronics Review | 2023 | 31 | 4 | e148221 | DOI: 10.24425/opelre.2023.148221

Słowa kluczowe: perovskites halides hybrid inorganic composites

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Abstrakt

In recent years, metal halide perovskites have gained significant attention due to their unique optical and electronic properties of semiconductor materials, which make them ideal for use in sustainable and energy-efficient devices. These devices include solar cells, lasers, and light-emitting diodes. Therefore, this review aims initially to provide an overview of the most important characteristics of metal halide perovskites, including their engineering development in various types, such as those based on lead or lead-free materials, like tin or germanium. Additionally, perovskites made from purely inorganic compounds like caesium bromide, chloride, or iodide, as well as hybrids mixed with organic compounds like formamidinium and methylammonium halides will be discussed. The goal is to improve their stability and efficiency. Secondly, some of the studies have proposed technologies combining electronic and mechanical characteristics of flexibility or rigidity as required, promoting their synthesis with different materials such as polymers (poly methyl methacrylate, polyvinylidene fluoride), biopolymers (starch, cyclodextrin, polylactic acid, and polylysines), among others. Finally, the subject of this work is to establish the main purpose of the research carried out so far, which is to develop simpler and more scalable processes at industrial level to achieve greater efficiency and duration in storage, exposure to visible light, critical environments, humid or high temperatures.

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Autorzy i Afiliacje

Hariana I. Farfan

e-mail:

ORCID:

Karol L. Roa

1 2

e-mail:

ORCID:

Hugo F. Castro

e-mail:

ORCID:

Universidad Pedagógica y Tecnológica de Colombia, Sogamoso, Boyacá, Colombia
National Polytechnic Institute, Ciudad de México, Mexico

8 Cost-effective titania layers over 100 nm thick – effect of annealing on the structural, morphological, and optical properties

Magdalena Zięba , Cuma Tyszkiewicz , Ewa Gondek , Katarzyna Wojtasik , Jacek Nizioł , Dominik Dorosz , Bartłomiej Starzyk , Patryk Szymczak , Wojciech Pakieła , Roman Rogoziński , Paweł Karasiński

Opto-Electronics Review | 2023 | 31 | 4 | e147913 | DOI: 10.24425/opelre.2023.147913

Słowa kluczowe: sol-gel titania layer dip-coating surface roughness optical properties

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Abstrakt

Titania dioxide (TiO₂) layers were synthesized via the acid-catalysed sol-gel route using titania (IV) ethoxide, and then annealed at temperatures varying in the range of 150–700 °C. The research concerned the effect of annealing temperature on the structure of TiO₂ layers, their surface morphology, and their optical properties. Further, X-ray diffractometry, and Raman spectroscopy were used to determine the structure of TiO₂ layers. Scanning electron and atomic force microscopy were used to study the surface morphology of TiO₂ layers. Transmittance, reflectance, absorption edge, and optical homogeneity were investigated by UV-VIS spectrophotometry, while the refractive index and thicknesses of TiO₂ layers were measured using a monochromatic ellipsometer. Chromatic dispersion characteristics of the complex refractive index were determined using spectroscopic ellipsometry. Structural studies have shown that the TiO₂ layers annealed at temperatures up to 300 °C are amorphous, while those annealed at temperatures exceeding 300 °C are polycrystalline containing only anatase nanocrystals with sizes increasing from 6 to 20 nm with the increase of the annealing temperature. Investigations on the surface morphology of TiO₂ layers have shown that the surface roughness increases with the increase in annealing temperature. Spectrophotometric investigations have shown that TiO₂ layers are homogeneous and the width of the indirect optical band gap varies with annealing temperature from 3.53 eV to 3.73 eV.

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Autorzy i Afiliacje

Magdalena Zięba

e-mail:

ORCID:

Cuma Tyszkiewicz

e-mail:

ORCID:

Ewa Gondek

e-mail:

ORCID:

Katarzyna Wojtasik

e-mail:

ORCID:

Jacek Nizioł

e-mail:

ORCID:

Dominik Dorosz

e-mail:

ORCID:

Bartłomiej Starzyk

e-mail:

ORCID:

Patryk Szymczak

e-mail:

ORCID:

Wojciech Pakieła

e-mail:

ORCID:

Roman Rogoziński

e-mail:

ORCID:

Paweł Karasiński

e-mail:

ORCID:

Department of Optoelectronics. Silesian University of Technology, ul. B. Krzywoustego 2, 44-100 Gliwice, Poland
Department of Physics, Cracow University of Technology, ul. Podchorążych 1, 30-084 Kraków, Poland
Faculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Krakow, Poland
Faculty of Materials Science and Ceramics AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Krakow, Poland
Department of Engineering Materials and Biomaterials, Silesian University of Technology, ul. Konarskiego 18a, 44-100 Gliwice, Poland

9 Vibration sensing with the optical fibre Mach-Zehnder interferometer

Anna T. Kurzych , Leszek R. Jaroszewicz

Opto-Electronics Review | 2023 | 31 | 4 | e148992 | DOI: 10.24425/opelre.2023.148992

Słowa kluczowe: Mach-Zehnder interferometer vibration sensor optical fibre technology

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Abstrakt

Vibration is a ubiquitous phenomenon that occurs in everyday life and people are exposed to it almost all the time. Most often, vibration is measured using electromechanical devices such as piezoelectric, piezoresistive, or capacitive accelerometers. However, attention should be paid to the limitations of such vibration sensors. They cannot operate in the presence of strong electromagnetic fields. Measurements with electromechanical devices require physical contact between the sensor and the vibrating object, which is not always possible due to the design of the sensor and device. The possibility of a non-contact vibration measurement in harsh environments is provided by the technology of interferometric fibre optic sensors. This paper reports the principle of operation, design aspects, experimentation, and performance of a Mach-Zehnder interferometric setup for the measurement of vibration frequency. There are different sensing arms implemented in the interferometer: single-mode, polarization-maintaining, and tapered optical fibre. The paper emphasises the simplicity of the set-up structure and the detection capabilities based on the interferometric sensing giving the possibility of constructing a commercial vibration sensor for all industry demands.

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Autorzy i Afiliacje

Anna T. Kurzych

e-mail:

ORCID:

Leszek R. Jaroszewicz

e-mail:

ORCID:

Institute of Technical Physics, Military University of Technology, ul. Gen. Sylwestra Kaliskiego 2, 00-908 Warsaw, Poland

Instrukcja dla autorów

Guide for Authors

https://www.editorialsystem.com/opelre/journal/for_authors/

OPTO-ELECTRONICS REVIEW is an open access journal. This involves the payment of an article publishing charge (APC) by the authors, their institution or funding body. We make the article freely available immediately upon publication on PAS Jornals platform (https://journals.pan.pl/opelre)

As of July 1st, 2024, there are changes in the fees for open access publications in Opto-Electronics Review: 2000 PLN (500 EUR) - up to 8 pages of the journal format and mandatory over-length charges of 200 PLN (50 EUR) per page (see the above link with instructions for Authors for details)

Articles submitted by June 30th, 2024: existing fee: 1750 PLN (or 400 EUR)

Articles submitted from July 1st, 2024: new fee: 2000 PLN (or 500 EUR) - a flat fee per paper up to 8 pages of the journal format (each additional page will be charged an additional 200 PLN or 50 EUR).

Dodatkowe informacje

Opto-Electronics Review was established in 1992 for the publication of scientific papers concerning optoelectronics and photonics materials, system and signal processing. This journal covers the whole field of theory, experimental verification, techniques and instrumentation and brings together, within one journal, contributions from a wide range of disciplines. Papers covering novel topics extending the frontiers in optoelectronics and photonics are very encouraged. The main goal of this magazine is promotion of papers presented by European scientific teams, especially those submitted by important team from Central and Eastern Europe. However, contributions from other parts of the world are by no means excluded.

Articles are published in OPELRE in the following categories:

-invited reviews presenting the current state of the knowledge,

-specialized topics at the forefront of optoelectronics and photonics and their applications,

-refereed research contributions reporting on original scientific or technological achievements,

-conference papers printed in normal issues as invited or contributed papers.

Authors of review papers are encouraged to write articles of relevance to a wide readership including both those established in this field of research and non-specialists working in related areas. Papers considered as “letters” are not published in OPELRE.

Opto-Electronics Review is published quarterly as a journal of the Association of Polish Electrical Engineers (SEP) and Polish Academy of Sciences (PAS) in cooperation with the Military University of Technology and under the auspices of the Polish Optoelectronics Committee of SEP.

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Policies and ethics:

The editors of the journal place particular emphasis on compliance with the following principles:

Ethical policy of Opto-Electronics Review

The ethical policy of Opto-Electronics Review follows the European Code of Conduct for Research Integrity and is also guided by the core practices and policies outlined by the Committee on Publication Ethics (COPE).

Authors must be honest in presenting their results and conclusions of their research. Research misconduct is harmful for knowledge.

Research results

Fabrication, falsification, or selective reporting of data with the intent to mislead or deceive is unethical, as is the theft of data or research results from others. The results of research should be recorded and maintained to allow for analysis and review. Following publication, the data should be retained for a reasonable period and made available upon request. Exceptions may be appropriate in certain circumstances to preserve privacy, to assure patent protection, or for similar reasons.

Authorship

All those who have made a significant contribution should be given chance to be cited as authors. Other individuals who have contributed to the work should be acknowledged. Articles should include a full list of the current institutional affiliations of all authors, both academic and corporate.

Competing interests

All authors, referees and editors must declare any conflicting or competing interests relating to a given article. Competing interests through their potential influence on behavior or content or perception may undermine the objectivity, integrity, or perceived value of publication.

Peer Review

We are committed to prompt evaluation and publication of fully accepted papers in Opto-Electronics Review’s publications. To maintain a high-quality publication, all submissions undergo a rigorous review process.

Characteristics of the peer review process are as follows:

• Simultaneous submissions of the same manuscript to different journals will not be tolerated.

• Manuscripts with contents outside the scope will not be considered for review.

• Opto-Electronics Review is a single-blind review journal.

• Papers will be refereed by at least 2 experts as suggested by the editorial board.

• In addition, Editors will have the option of seeking additional reviews when needed. Authors will be informed when Editors decide further review is required.

• All publication decisions are made by the journal’s Editor-in-Chief based on the referees’ reports. Authors of papers that are not accepted are notified promptly.

• All submitted manuscripts are treated as confidential documents. We expect reviewers to treat manuscripts as confidential material.

• Editors and reviewers involved in the review process should disclose conflicts of interest resulting from direct competitive, collaborative, or other relationships with any of the authors, and remove oneself from cases in which such conflicts preclude an objective evaluation. Privileged information or ideas that are obtained through peer review must not be used for competitive gain.

• A reviewer should be alert to potential ethical issues in the paper and should bring these to the attention of the editor, including any substantial similarity or overlap between the manuscript under consideration and any other published paper of which the reviewer has personal knowledge. Any statement, observation, derivation, or argument that had been previously reported should be accompanied by the relevant citation.

• Personal criticism is inappropriate.

Plagiarism

Reproducing text from other papers without properly crediting the source (plagiarism) or producing many papers with almost the same content by the same authors (self-plagiarism) is not acceptable. Submitting the same results to more than one journal concurrently is unethical. Exceptions are the review articles. Authors may not present results obtained by others as if they were their own. Authors should acknowledge the work of others used in their research and cite publications that have influenced the direction and course of their study.

Plagiarism is not tolerated. All manuscripts submitted to Opto-Electronics Review will be checked for plagiarism (copying text or results from other sources) and self-plagiarism (duplicating substantial parts of authors’ own published work without giving the appropriate references) using the CrossCheck database (iThenticate plagiarism checker).

Duplicate submission

Simultaneous submissions of the same manuscript to different journals will not be tolerated. The submitted article will be removed without consideration.

Corrections and retractions

All authors have an obligation to inform and cooperate with journal editors to provide prompt retractions or correction of errors in published works.

• The journal will issue retractions if:

• There is clear evidence that the findings are unreliable, either as a result of misconduct (e.g., data fabrication or honest error - miscalculation or experimental error);

• The findings have previously been published elsewhere without proper cross-referencing, permission or justification (i.e., cases of redundant publication);

• It constitutes plagiarism;

• It reports unethical research.

• The journal will issue errata, if:

• A small portion of an otherwise reliable publication proves to be misleading (especially because of honest error);

• The author list is incorrect.

Other forms of misconduct include failure to meet clear ethical and legal requirements such as misrepresentation of interests, breach of confidentiality, lack of informed consent and abuse of research subjects or materials. Misconduct also includes improper dealing with infringements, such as attempts to cover up misconduct and reprisals on whistleblowers.

The primary responsibility for handling research misconduct is in the hands of those who employ the researchers. If a possible misconduct is brought to our attention, we will seek advice from the referees and the Editorial Board. If there is the evidence, we will resolve the matter by appropriate corrections in the printed and online journal; by refusing to consider an author's future work and by contacting affected authors and editors of other journals.

Human and Animal Rights

If the work involves the use of human subjects, the author should ensure that the work described has been carried out in accordance with The Code of Ethics of the World Medical Association (Declaration of Helsinki) for experiments involving humans; Uniform Requirements for manuscripts submitted to Biomedical journals. Authors should include a statement in the manuscript that informed consent was obtained for experimentation with human subjects. The privacy rights of human subjects must always be observed.

All animal experiments should comply with the ARRIVE guidelines and should be carried out in accordance with the EU Directive 2010/63/EU for animal experiments, and the authors should clearly indicate in the manuscript that such guidelines have been followed.